ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,566, issued on June 30, was assigned to Koninklijke Philips N.V. (Eindhoven, Netherlands). "Enhancing angiograms" was invented by Vincent M... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,567, issued on June 30, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Video conference appearance validation and r... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,568, issued on June 30, was assigned to Norfolk Southern Corp. (Atlanta). "Machine-learning framework for detecting defects or conditions o... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,569, issued on June 30, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate analysis system, substrate analysis method, and recording m... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,570, issued on June 30, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "3D volume inspection method and method of configuring o... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,571, issued on June 30, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.). "System and method for tomograph... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,572, issued on June 30, was assigned to BEIJING BOE TECHNOLOGY DEVELOPMENT Co. LTD. (Beijing) and BOE TECHNOLOGY GROUP Co. LTD. (Beijing). ... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,573, issued on June 30, was assigned to SAMSUNG SDI Co. LTD. (Yongin-si, South Korea) and NSYS Corp.. "System for finding black spots in a ... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,574, issued on June 30, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Apparatus and method for predicting weld quality" was invente... Read More
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,575, issued on June 30, was assigned to ASML Netherlands B.V. (Veldoven, Netherlands). "Patterning parameter determination using a charged ... Read More